DSF900

DSF900

฿0.00

DSF900 is a digital contour and roughness measuring instrument to achieve wide dynamic range measurements with high accuracy.



  • Various parameters of surface roughness or waviness and various contour are analyzable.


PDF catalog

Brand KOSAKA LABORATORY
OR
Description

Details

Z resolution / measuring range

0.00075 μm / ±6 mm (0.0015 μm / ±12 mm)

Z detection method

Semiconductor laser scale

Stylus

R2 μm / 0.75 mN / 60°  R25 μm / 10 mN / 25°

Analysis item

Contour (element, scalar, statistics, master comparison, tolerance judge)
Roughness (JIS, ISO, DIN, ANSI, BS)
Waviness (JIS)

 

Reviews
5 star
0
4 star
0
3 star
0
2 star
0
1 star
0

Image

Feature

Upsell products