DSF600

DSF600

฿0.00

By 1 scanning, contour and roughness or waviness are able to be gained



  • High resolution and wide dynamic range

  • Suitable for complex-shape precision components


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Brand KOSAKA LABORATORY
OR
Description

Details

Z resolution / measuring range

0.0075 μm / 5 mm  0.012 μm / 8 mm

Stylus

R2 μm / 0.75 mN / 60 °  R25 μm / 10 mN / 25°

Analysis item

Contour (element, scalar, statistics, tolerance judge)
Roughness (JIS, ISO, DIN, ANSI, BS)
Waviness (JIS)

 

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