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High Resoluion X-Ray Inpection
 

phoenix|x-ray is the product-line of GE Sensing & Inspection Technologies for high-resolution 2D X-ray inspection systems and 3D computed tomography systems.  The product lines headquarters, including production, research and development, are located in Wunstorf, near the town of Hanover in Germany. Additional customer service centers are located in Stuttgart, Munich, Limonest (France), St. Petersburg (Florida, USA), Newark (California, USA) and Manila (Philipines) with another scheduled to open in Shanghai.

High-resolution X-ray inspection with resolutions in the submicrometer range has become a widely used tool for non-destructive failure analysis and process control in a variety of industrial and scientific fields.





 
Cone Beam Computed Tomography
In computed tomography, a three-dimensional image is generated by rotating the object in very small steps (<1°) 360 °around a single axis of rotation while taking a series of two-dimensional X-ray images. Afterwards, the final three-dimensional image is numerically reconstructed based on the two- dimensional images and is displayed either as a series of sectional images or a three-dimensional image.
 

Fan Beam Computed Tomography
The sample is rotated by 360 degree while line images are taken. Based on this data, a sectional image of the irradiated spot is created. In order to create more sectional images, the sample is moved slowly through the fanned beam. Then, a three-dimensional image can be recreated based on a series of sectional images. Once there is a series of sectional images, volume reconstruction may be performed and the result be displayed as several sectional or one three-dimensional image.

This procedure is more time-consuming than computed tomography using a cone beam, but is very precise and is the approach of choice for dimensional measuring.
 

Precondition for Computed Tomography
As a rule, any object that can be completely penetrated by radiation, in any direction perpendicular to the axis of rotation, can be inspected using Computed Tomography, provided its diameter does not exceed the size of the effective detector area. Is the sample diameter larger than the effective detector, then the sample cannot be viewed in its entirety on the monitor.
  2D X-ray inspection systems
  3D X-ray inspection systems
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