bench|mate is an economically priced, very compact high-resolution X-ray system for a variety of inspection tasks. Its modular setup enables the customer to easily upgrade the system to meet more advanced inspection requirements.

microme|x is a high-resolution submicron X-ray system for the inspection of solder joints and electronic components.

ml|inspector is a high-resolution microfocus X-ray system designed for inspecting multilayer boards.

nanome|x is an ultra high-resolution nanofocus X-ray system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. This system is upgradable to a nanoCT®.

ndt|analyser is a high-resolution X-ray system, equipped with an open X-ray tube, for quality and failure analysis of large-volume and/ or heavy objects.

pcba|inspector is a high-resolution microfocus X-ray inspection system designed for inspecting solder joints in board assemblies.

x|argos is a high-resolution X-ray inspection system specifically designed for extra large objects up to 100kg/220.46 lb.