White Light Interferometer DM 6000 M
 
WLI on the basis of a conventional microscope

  • Option A: Extension of a conventional interferable phase shift microscope to a white light interferometer
  • Option B: white light interferometer on the basis of the phase shift microscope LEICA DM 6000M
  • Fast and highly accurate inspection and characterization of surface topography
  • Conventional microscope and accuracy resolution in nm-range within one system
  • Fast surface inspection by interferometric principle
  • Modular configuration Aufbau
  • High amplitude range

Interference objectives

  • Magnifications: 5x, 20x, 50x
  • Quality of reference area: lambda/20 p-V evenness
Fields of application
  • Inspection of even and heavy structured surfaces in the nm-range
  • Defect- and roughness analysis
  • Measuring of micro deformations
Software
  • Surface measuring software WLI 2000
  • 3D visualizing- und measuring software ARGUS 3.30
  • Analyzing software FRT Mark II
    White light interferometer mode:
  • Measuring field:
    130 µm x 130 µm...2.1 mm x 2.1 mm
  • Number of measuring points:
  • 1,024 x 1,024
  • Vertical measurement range:
    up to 500 µm
  • Vertical resolution:
    range up to 100 µm: < 25 nm
    100 - 500 µm: < 2 µm
  • Step height measuring accuracy:
    range up to 100 µm: < 2 nm
    100-500 µm: < 25 nm
  • Vertical scan rate:
    up to 2 µm/s, typ. 1 µm/s
  Phase shift mode:
  • Measuring field:
    130 µm x 130 µm ... 2.1 mm x 2.1 mm
  • Number of measuring points:
  • 1,024 x 1,024
  • Maximum stage height:
    120 nm
  • Vertical measurement range:
    12 µm
  • Vertical resolution:
    < 1 nm
  • Measuring time:
    < 10 s